The Caliber™ scanning probe microscope (SPM) from Veeco Instruments (Woodbury, NY) can perform various SPM research and industrial applications on samples of differing sizes. The SPM’s open-platform, closed-loop design allows researchers to customize hardware. Features include real-time software with line-by line analysis, oscilloscope, FFT, and leveling functions. Proprietary electronic control provides a triple-DAC design for 16-bit scan control at any scan range and offset. The system utilizes integrated optics with a color camera, enabling engineers to judge tip-sample separation. Image modes include contact mode, tapping mode, phase imaging, lateral force microscopy (LFM), force modulation microscopy (FMM), force distance curves, and optional nanolithography. The system can scan up to 90μm on most surfaces.


Photonics Tech Briefs Magazine

This article first appeared in the November, 2006 issue of Photonics Tech Briefs Magazine.

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