CRAIC Technologies (San Dimas, CA) has introduced an automated version of the 20/30 Perfect Vision™ UV-visible- NIR microspectrophotometer. This system is designed to be fully programmable with touchscreen controls so that it can automatically analyze microscopic samples with UV-visible-NIR spectroscopy and microscopy. Imaging and spectroscopic analysis of samples can be done by absorbance, reflectance and fluorescence from the deep UV to far into the near infrared.

Applications include contamination analysis of hard disk components, thin film measurement of semiconductors, microcolorimetry of flat panel displays and quality control of pharmaceuticals. Sophisticated software, ranging from image analysis, spectral analysis, film thickness determination and even colorimetry are all available to enhance the capabilities of the automated 20/30 PV™ microspectrophotometer.

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Photonics Tech Briefs Magazine

This article first appeared in the September, 2013 issue of Photonics Tech Briefs Magazine.

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