Sensofar Metrology (Terrassa, Spain/Scottsdale, AZ) has released two new surface metrology systems. The S lynx, a non-contact 3D surface profiler, integrates confocal, interferometry, and focus variation techniques into the same sensor head. The S onix, an ultra-compact 3D surface sensor, is purpose-designed for high-speed in-line process measurement and process control tasks. The S onix sensor system features a single measurement technique: interferometric – VSI.

Both systems have been designed for surface measurement applications requiring fast, non-invasive assessment of the 3D micro- and nano-geometry of technical surfaces, including surface roughness, textures and structuring, and thickness measurements.

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This article first appeared in the June, 2016 issue of Sensor Technology Magazine.

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