An updated software model has been developed for predicting the single-event effect (SEE) rates in circuit designs as they are being designed. This tool will be used for estimating the frequency of the various SEEs, such as logic upsets and circuit latch-up. It may also be used to estimate the total radiation dose effects to microelectronic devices operated in the natural space radiation environment or in ionizing radiation test environments.

The resulting model code is available on the https://creme.isde.vanderbilt.edu/CREME-MC/ Web site. It has the capability to transport the external environment through a uniform layer of aluminum shielding with a thickness specified by the user, or use the uploaded distribution of aluminum layer thickness computed by the user. Such a distribution can be used to account for the distribution of shielding thicknesses surrounding an electronic component of interest within a spacecraft. In either case, it will compute both the radiation dose and the SEE rates for the part of interest. This site replaces the CREME96 Web site at the Naval Research Laboratory with an updated version that incorporates a new, more secure user interface that also gives access to the newly created capabilities. This site also includes the older CREME86 legacy code, and the new Monte Carlo extension. Many spacecraft parts specifications and contracts still specify CREME86 by name as part of the radiation hardening process. The Monte Carlo extension brings a much higher level of physical fidelity to the radiation simulations by relaxing many simplifying assumptions made by CREME86 and CREME96. Additionally, this new Web site will incorporate many security extensions including, perhaps most importantly, UNIX as the underlying computer operating system.

This work was done by James Adams of Marshall Space Flight Center; and Robert Weller, Robert Reed, Brian Sierawski, and Marcus Mendenhall of Vanderbilt University. For more information, contact Ronald C. Darty, Licensing Executive in the MSFC Technology Transfer Office, at This email address is being protected from spambots. You need JavaScript enabled to view it.. Refer to MFS-32806-1.