An Automated Test Case Generator computer program generates parameter-based test cases for testing software and hardware systems. Given N parameters — each of which represents a kind of variation for testing — and a finite set of possible values for each parameter, the program generates individual test cases by selecting a value for each parameter. Collectively, test cases cover the space of possible combinations to a degree specified by the user. The program selects parameter values according to a combinatorial design that generates a near-minimum number of test cases to afford the user-specified coverage. The program is especially suitable for systems having a large number of value combinations in which there is a need for a user-specified degree of coverage in a relatively small test suite. An evaluation on test parameters from the Deep Space One mission revealed that this program generated fewer test cases than did a prior test-case-generator program. The performance of this program is comparable to that of an Internet-based service called AETG. However, unlike AETG, this program uses a purely deterministic algorithm, is amenable to modification by the user, and can be incorporated into other programs.

This program was written by Yu-Wen Tung, Daniel Dvorak, Eugene Chalfant, and Wafa Aldiwan of Caltech for NASA's Jet Propulsion Laboratory. For further information, access the Technical Support Package (TSP) free on-line at www.nasatech.com/tsp  under the Software category.

This software is available for commercial licensing. Please contact Don Hart of the California Institute of Technology at (818) 393-3425. Refer to NPO-21195.

array(0) { }
This Brief includes a Technical Support Package (TSP).

Unfortunately the TSP Computer Program Generates Test Cases (reference NPO-21195) appears to be missing from our system.

Please contact This email address is being protected from spambots. You need JavaScript enabled to view it. for assistance in retrieving it.

Don't have an account? Sign up here.


NASA Tech Briefs Magazine

This article first appeared in the November, 2001 issue of NASA Tech Briefs Magazine.

Read more articles from the archives here.