On-Demand Webinars: Manufacturing & Prototyping

Using High-Resolution X-ray Computed Tomography to Inspect Additive Manufactured Parts

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Additive manufacturing (AM) techniques are quickly replacing conventional “subtractive” machining for producing low volumes of complex parts. While some of these parts may be used for safety-critical functions, their complex nature means they are less suited to conventional inspection techniques, for example, eddy currents or ultrasonics. X-ray micro-computed tomography (µCT) is the only technique that gives a full three-dimensional quantitative picture of the structure of a part, both internal and external, showing density variations, dimensional mismatches, voids, and inclusions, and allows accurate measurements of these to be made.

This 30-minute Webinar explains how µCT works and how the full 3D inspection of complex AM parts can give users confidence in this exciting new technology.

An audience Q&A follows the technical presentation.

Speakers:

Andrew Ramsey, X-ray CT Consultant, Nikon Metrology

Andrew Ramsey graduated in physics from the University of Cambridge in 1986 and has been working in X-ray computed tomography since the early 1990s, first as a software engineer and then as a technical advisor to sales staff and customers worldwide. Originally based out of Nikon Metrology’s U.K. factory, Andrew has been supporting sales in the Americas from the company’s office in Brighton, Michigan since 2018.

Chris Peitsch, Business Development Manager, X-ray/CT Systems, Avonix Imaging

Chris Peitsch is the Business Development Manager of X-ray/CT Systems at Avonix Imaging. He is a recognized subject matter expert in radiography and X-ray computed tomography and its applications. Chris joined the Avonix Imaging team in 2020 and currently leads business development of X-ray and CT systems.

Moderator:

Bruce Bennett, Editor, SAE Media Group

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