On-Demand Webinars: Photonics/Optics

Lunch & Learn: Latest in Digital Microscopy

SPONSORED BY:

Today’s 20-minute Lunch & Learn delves into why incomplete microscopy inspection may be a bigger problem than you realize. Classic inspection systems offer a shallow depth of field, which can cause sample parts not to be in focus and, thus, leads to missing features, user fatigue, and incomplete inspection.

See a live demo of a unique technology for optical inspection that enables instant, real-time, all-in-focus imaging. The session ends with an audience Q&A.

The first 50 to register and attend the presentation will receive a $5 credit from Grubhub (U.S. residents only).

Speakers:

Trevor Campbell, Industrial Microscopy Product Manager, ZEISS Industrial Quality Solutions