Wire-testing issues, such as the gripping strains imposed on the wire, play a critical role in obtaining clean data. In a standard test frame fitted with flat wedge grips, the gripping action alone creates stresses on the wire specimen that cause the wire to fail at the grip location. When conventional wire grip fixtures are installed, the test span as well as the amount of wire used increase dramatically due to the large nature of the wire testing fixture. A new test frame, which is outfitted with a vacuum chamber, negated the use of any conventional commercially available wire test fixtures, as only 7 in. (17.8 cm) existed between the grip faces.