Home >> Tech Briefs >> Electronics & Computers >> Pattern Generator for Bench Test of Digital Boards

Pattern Generator for Bench Test of Digital Boards

advertisement:

Fresh data is streamed continuously for many tens of seconds with no gaps at 40 MHz.

All efforts to develop electronic equipment reach a stage where they need a board test station for each board. The SMAP digital system consists of three board types that interact with each other using interfaces with critical timing. Each board needs to be tested individually before combining into the integrated digital electronics system. Each board needs critical timing signals from the others to be able to operate. A bench test system was developed to support test of each board. The test system produces all the outputs of the control and timing unit, and is delivered much earlier than the timing unit.

Viewing entire briefs requires login/registration. Registration is free and easy to complete. If you're already registered with Tech Briefs, simply login at the top of the page.

>> Trending this Month

>> Newsletter

Subscribe today to receive the INSIDER, a FREE e-mail newsletter from NASA Tech Briefs featuring exclusive previews of upcoming articles, late breaking NASA and industry news, hot products and design ideas, links to online resources, and much more.

Sign up now >>