Low-current, high-impedance microelectronic devices can be affected by electric current shot noise more than they are affected by Nyquist noise, even at room temperature. An approach to implementing a sub-shot noise current source for powering such devices is based on direct conversion of amplitude- squeezed light to photocurrent.

The phenomenon of optical squeezing allows for the optical measurements below the fundamental shot noise limit, which would be impossible in the domain of classical optics. This becomes possible by affecting the statistical properties of photons in an optical mode, which can be considered as a case of information encoding. Once encoded, the information describing the photon (or any other elementary excitations) statistics can be also transmitted. In fact, it is such information transduction from optics to an electronics circuit, via photoelectric effect, that has allowed the observation of the optical squeezing. It is very difficult, if not technically impossible, to directly measure the statistical distribution of optical photons except at extremely low light level. The photoelectric current, on the other hand, can be easily analyzed using RF spectrum analyzers. Once it was observed that the photocurrent noise generated by a tested light source in question is below the shot noise limit (e.g. produced by a coherent light beam), it was concluded that the light source in question possess the property of amplitude squeezing.

The main novelty of this technology is to turn this well-known information transduction approach around. Instead of studying the statistical property of an optical mode by measuring the photoelectron statistics, an amplitudesqueezed light source and a high-efficiency linear photodiode are used to generate photocurrent with sub-Poissonian electron statistics.

By powering microelectronic devices with this current source, their performance can be improved, especially their noise parameters. Therefore, a room-temperature sub-shot noise current source can be built that will be beneficial for a very broad range of low-power, low-noise electronic instruments and applications, both cryogenic and room-temperature. Taking advantage of recent demonstrations of the squeezed light sources based on optical micro-disks, this sub-shot noise current source can be made compatible with the size/power requirements specific of the electronic devices it will support.

This work was done by Dmitry V. Strekalov, Nan Yu, and Kamjou Mansour of Caltech for NASA’s Jet Propulsion Laboratory. NPO-47949



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Sub-Shot Noise Power Source for Microelectronics

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This article first appeared in the October, 2011 issue of NASA Tech Briefs Magazine (Vol. 35 No. 10).

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Overview

The document titled "Sub-Shot Noise Power Source for Microelectronics" from NASA's Jet Propulsion Laboratory discusses a novel technology aimed at enhancing the performance of microelectronic devices by addressing the limitations imposed by electronic noise. As microelectronics continue to miniaturize, the discrete nature of matter and quantum mechanical interactions increasingly influence device performance.

The primary focus of the research is on the phenomenon of noise in electronic circuits, which arises from two main sources: Johnson-Nyquist noise and shot noise. Johnson-Nyquist noise is caused by thermal fluctuations in resistors, while shot noise results from the random distribution of electrons passing through a conductor. Both types of noise are classified as white noise, but they differ in their dependence on circuit and signal parameters. The document emphasizes that shot noise often dominates in devices operating above a certain voltage threshold, particularly in low-power applications.

A key innovation presented is the use of amplitude-squeezed light sources to generate photocurrents with sub-Poissonian electron statistics. This approach allows for the creation of a sub-shot noise current source that can significantly improve the noise performance of microelectronic devices. By utilizing high-efficiency linear photodiodes powered by amplitude-squeezed light, the proposed technology aims to enhance the signal-to-noise ratio (SNR) in shot noise-limited scenarios.

The document highlights the potential applications of this technology in various microelectronic devices, such as vertical cavity surface emitting lasers (VCSELs), which are often limited by shot noise. The ability to generate low-noise currents at room temperature opens up new possibilities for a wide range of low-power, low-noise electronic instruments.

In summary, the research presents a transformative approach to mitigating electronic noise in microelectronics through the integration of quantum mechanics and advanced optical techniques. By leveraging the properties of squeezed light, this technology promises to enhance the performance and efficiency of future electronic devices, paving the way for advancements in various scientific and commercial applications.