Electronics & Software

Electrical/​Electronics

New technologies in power supplies and management, board-level electronics, electronics and computers, and battery systems provide wide-ranging applications essential to military, aviation, medical, and automotive.

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Briefs: Electronics & Computers
Cross-diffraction gratings have been proposed to provide optical coupling to quantum-well infrared photodetectors (QWIPs) in focal-plane arrays (FPAs). The cross-grating coupling scheme is...
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Briefs: Photonics/Optics
Laser Doppler velocimetry (LDV) systems have been used for a number of years in field and laboratory applications. The normal LDV system consists of a two-color, four-beam...
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Briefs: Electronics & Computers
Passivation by coating with OCG285 (or equivalent) polyimide at critical steps of fabrication has been found to enhance the quality of tapered edges in high-critical-temperature...
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Briefs: Electronics & Computers
A newly developed instrument, designed at Marshall Space Flight Center, uses the resistance to alternating current running through a device to measure the variances in...
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Briefs: Electronics & Computers
Reducing Surface Leakage Currents in FPAs of QWIPs
Chemical surface treatments during fabrication have been proposed to reduce surface leakage currents in focal-plane arrays (FPAs) of quantum-well infrared photodetectors (QWIPs). For reasons explained below, if most or all of the surface leakage currents could be eliminated by such treatments,...
Briefs: Electronics & Computers
Image-Matching System Highlights Changes in Skin Lesions
A video imaging and image-data-processing system for use in dermatological examinations acquires and processes images of patients' skins. The system processes a current image of a selected area of a patient's skin along with an image of the same area acquired previously, generating a...
Briefs: Electronics & Computers
A diagnostic signal-analysis technique, called the Phase Synchronized Enhancement Method (PSEM), has been developed. This method allows NASA engineers to retrieve any unique defect...
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