Test & Measurement

Many networks rely on firewalls or filtering routers for frontline network security. Packet filtering firewalls or routers filter incoming or outgoing packets based on a set of access rules. The IP (Internet Protocol) Packet Generator computer program assists in verifying that a packet filtering firewall...

A technique that involves pressurization with a radioactive gas has been proposed to solve two problems associated with canisters used to transport samples from remote bodies (planets, moons, asteroids, or comets) back to Earth. The canisters must be sealed at the sampling locations. The...

An improved method of noncontact measurement of the surface tension of a molten material has been developed, partly to overcome the disadvantages of contact measurement techniques as described in the preceding article, "Noncontact Measurement of Resistivity of Molten Material"...

It is now possible to determine the electrical resistivity of a molten sample of a pure, electrically conductive material (a metal or semiconductor), without contact between the sample or any solid object. Once the electrical resistivity has been determined, the thermal conductivity can be...

The Shuttle Connector Analysis Network Automated Electrical Retest Operations (SCAN/AERO) computer program assists in the tracking, management, and automation of the retesting of electrical connectors on the space shuttle orbiters. Among other things, SCAN/AERO analyzes test data to...

Two reports describe early phases of continuing studies directed toward the selection and adaptation of industrial work-measurement and methods-analysis procedures for application to the Orbiter Processing Facility (OPF) at Kennedy Space Center. These studies were prompted by a need to...

Inexpensive, high-performance, optically coupled temperature and strain gauges based on a combination of advanced optoelectronic and microelectromechanical concepts have been proposed. The sensors would contain vibrating beams with submillimeter dimensions, made primarily of silicon by...